Wavelength influence in sub-pixel temperature retrieval using the dual-band technique

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V. Lombardo
L. Merucci
M. F. Buongiorno

Abstract

The thermal model proposed by Crisp and Baloga (1990) for active lava flows considers thermal flux as a function
of the fractional area of two thermally distinct radiant surfaces. In this model, the larger surface area corresponds
to the cooler crust of the flow and the other, much smaller to fractures in the crust. These cracks temperature
is much higher than the crust one and approaches the temperature of the molten or plastic interior flow.
The dual-band method needs two distinct SWIR (short wave infrared) bands to formulate a two equations system
from the simultaneous solution of the Planck equation in each band. The system solutions consist in the crust
temperature and the fractional area of the hot component. The dual band technique originally builds on data acquired
by sensors (such as Landsat TM) with two SWIR bands only. The use of hyperspectral imaging spectrometers
allows us to test the dual-band technique using different wavelengths in the SWIR range of the spectrum.
DAIS 7915 is equipped with 40 bands into the range 1.54-2.49 nm which represent potential input in dual band
calculation. This study aims to compare results derived by inserting assorted couples of wavelengths into the
equation system. The analysis of these data provides useful information on dual-band technique accuracy.

Article Details

How to Cite
Lombardo, V., Merucci, L. and Buongiorno, M. F. (2006) “Wavelength influence in sub-pixel temperature retrieval using the dual-band technique”, Annals of Geophysics, 49(1). doi: 10.4401/ag-3173.
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